Below you will find pages that utilize the taxonomy term “Test” Wafer burn in test heating lamp On the line, a wafer’s thermal budget is fixed. One hotspot during burn-in, and the failure mechanism slips into the data instead of getting forced... Read more...
Wafer burn in test heating lamp On the line, a wafer’s thermal budget is fixed. One hotspot during burn-in, and the failure mechanism slips into the data instead of getting forced... Read more...
